IEEE Standard 1671 & 1641 Series

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0楼发表于: 2014-12-18 17:18:13

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关键词： 2010 2009 Standard

IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML," IEC 61671:2012(E) (IEEE Std 1671-2010) , vol., no., pp.1,391, July 16 2012

doi: 10.1109/IEEESTD.2012.6238292

Abstract: This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.

keywords: {Automation;IEEE standards;Instrumentation;Testing;XML;ATE description;ATE test results;ATML;ATS;ITA;SI;UUT description;UUT maintenance;XML instance document;XML schema;automatic test equipment;automatic test markup language;automatic test system;interface test adapter;synthetic instrumentation;test configuration;unit under test},

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions," IEEE Std 1671.1-2009 (Full_Use) , vol., no., pp.1,195, Dec. 11 2009

doi: 10.1109/IEEESTD.2009.6781521

Abstract: This document specifies an exchange format, using the extensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a Unit Under Test (UUT). This is in support of the development of Test Program Sets (TPSs) that will be used in an automatic test environment.

keywords: {Automatic test equipment;IEEE standards;Markup languages;Test requirements;Testing;XML;1671.1-2009;Automatic Test Markup Language (ATML);Automatic Test Markup Language (ATML) instance document;Test Program Set (TPS);Test Requirements Document (TRD);XML schema;automatic test equipment (ATE);automatic test system (ATS);diagnostic requirements;test description;test requirements},

IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description," IEEE Std 1671.2-2012 (Revision of IEEE Std 1671.2-2008) , vol., no., pp.1,52, Feb. 15 2013

doi: 10.1109/IEEESTD.2013.6461897

Abstract: An exchange format is specified in this standard, using extensible markup language (XML), for identifying instrumentation that may be integrated in an automatic test system (ATS) that is to be used to test and diagnose a unit under test (UUT).

keywords: {IEEE standards;XML;automatic test software;ATML instrument description;ATS;IEEE Std 1671.2 2008 Revision;IEEE Std 1671.2 2012;IEEE standard;UUT;XML;automatic test markup language instrument description;automatic test system;exchange format;extensible markup language;unit under test;Automatic test equipment;IEEE standards;Instrumentation;XML;ATML instance document;ATS;Automatic Test Markup Language (ATML);IEEE 1671.2;XML schema;automatic test equipment (ATE);automatic test system;instrument;instrumentation;synthetic instrument},

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information," IEEE Std 1671.3-2007 , vol., no., pp.1,33, March 28 2008

doi: 10.1109/IEEESTD.2008.4479571

Abstract: This document specifies an exchange format, using XML, for identifying all of the hardware, software, and documentation associated with a unit under test (UUT). This UUT may be tested and diagnosed using a test program set (TPS) on an automatic test system (ATS).

keywords: {ATML instance document;Automatic Test Markup Language (ATML);XML schema;automatic test equipment (ATE);automatic test system (ATS);unit under test (UUT)},

IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration," IEEE Std 1671.4-2014 (Revision of IEEE Std 1671.4-2007) , vol., no., pp.1,54, April 30 2014

doi: 10.1109/IEEESTD.2014.6808402

Abstract: An exchange format is specified in this standard, using extensible markup language (XML), for identifying the test configuration used to test for and diagnose faults of a unit under test (UUT) on an automatic test system (ATS).

keywords: {IEEE standards;XML;automatic test software;fault diagnosis;ATML test configuration;ATS;IEEE Std 1671.4-2007 revision;IEEE Std 1671.4-2014;IEEE standard;UUT;XML;automatic test markup language;automatic test system;exchange format;extensible markup language;faults diagnose;test configuration;IEEE standards;Test configuration;XML;ATML instance document;Automatic Test Markup Language (ATML);IEEE 1671.4(TM);Master Configuration Control Document (MCCD);Master Test Program Set Index (MTPSI);XML schema;automatic test equipment (ATE);automatic test system (ATS);station configuration file;test configuration},

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information," IEEE Std 1671.5-2008 (Full_Use) , vol., no., pp.1,29, Feb. 1 2012

doi: 10.1109/IEEESTD.2012.6781503

Abstract: An exchange format, utilizing XML, for identifying all of the hardware, software, anddocumentation associated with a test station is specified in this document. This test station maybe used as a component of a test program set to test and diagnose a unit under test.

keywords: {Automatic test equipment;IEEE standards;Markup languages;Test requirements;Testing;XML;1671.5-2008;ATML instance document;Automatic Test MarkupLanguage (ATML);XML schema;automatic test equipment (ATE);automatic test system (ATS);interface device (ID);interface test adapter(ITA);test adapter;test fixture},

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information," IEEE Std 1671.6-2008 (Full-Use) , vol., no., pp.1,30, Feb. 1 2013

doi: 10.1109/IEEESTD.2013.6809830

Abstract: An exchange format, utilizing XML, for identifying all of the hardware, software, anddocumentation associated with a test station is specified in this document. This test station maybe used as a component of a test program set to test and diagnose a unit under test.

keywords: {Automatic test equipment;IEEE standards;Information exchange;Testing;XML;1671.6-2008;ATML instance document;Automatic Test MarkupLanguage (ATML);XML schema;automatic test equipment (ATE);automatic test system (ATS);test station},

IEEE Standard for Signal and Test Definition," IEEE Std 1641-2010 (Revision of IEEE Std 1641-2004) , vol., no., pp.1,334, Sept. 17 2010

doi: 10.1109/IEEESTD.2010.5578923

Abstract: This standard provides the means to define and describe signals used in testing. It also provides a set of common basic signals, built upon formal mathematical specifications so that signals can be combined to form complex signals usable across all test platforms.

keywords: {IEEE standards;automatic test equipment;IEEE standard;signals testing;Automatic testing;IEEE standards;Testing;ATE;ATLAS;IEEE 1641;UUT;automatic test equipment;signal definitions;test definitions;test requirements;test signals;unit under test},

IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition," IEEE Std 1641.1-2013 (Revision of IEEE Std 1641.1-2006) , vol., no., pp.1,324, June 7 2013

doi: 10.1109/IEEESTD.2013.6525309

Abstract: Guidance in the use of the signal and test definition (STD) standard, IEEE Std 1641-2010, is provided. IEEE Std 1641 provides the means to define and describe signals used in testing. This guide describes how to form complex signals usable across all test platforms.

keywords: {IEEE standards;signal detection;IEEE Standard;IEEE Std 1641-2010;IEEE Std 1641.1- 2013;IEEE Std 1641.1-2006 Revision;Automatic test equipment;IEEE standards;Signal processing;Terminology;ATE;ATLAS;ATML;ATS;IEEE 1641.1;UUT;automatic test equipment;signal definitions;test definitions;test requirements;test signals;unit under test},

最后这个有难度，是Draft Standard。

IEEE Draft Recommended Practice for Using IEEE 1671.2 Instrument Description Templates fo ..

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