[其它]De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circui

De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB -examinations in one-port measurements- 583ej2HPg  
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Maeda, K. ; Iokibe, K. ; Toyota, Y. ; Koga, R. ; SOb17:o3|  
Grad. Sch. of Natural Sci. & Technol., Okayama Univ., Okayama, Japan FRF3V>  
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This paper appears in:  Environmental Electromagnetics, 2009. CEEM 2009. 5th Asia-Pacific Conference on  Issue Date : 16-20 Sept. 2009                                                                                          --> Vm'ReH  
Issue Date :  16-20 Sept. 2009 -Hh$3Uv  
On page(s): 246 - 249 KD$P\(5#  
Print ISBN: 978-1-4244-4344-4 [ w  
References Cited: 1 .!KlN%As  
INSPEC Accession Number: 10955102 }zRYT_
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Digital Object Identifier :  10.1109/CEEM.2009.5303985 aBr%"&Z.MG  
Date of Current Version :   30 十月 2009 <E$P  
Abstract o%h\55S  
In this paper, the authors evaluate T-matrix extraction method. The method is de-embedding DUT by T-matrix from actual measurement comprising both the parasitics and DUT. The proposed method were more accurate than that by the port-extension function. Result for different trace pattern gave similar results for RC series circuit up to 2 GHz. The c .. 4en&EWUr  
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