[其它]A Straightforward De-Embedding Method for Devices Embedded in Test Fixtures

A Straightforward De-Embedding Method for Devices Embedded in Test Fixtures 7hNb/O004  
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Reynoso-Hernandez, J. A. ; Inzunza-Gonzalez, Everardo ; /ONV5IkPy  
Centro de Investigación Científica y de Educación Superior de Ensenada (CICESE) División de Física Aplicada, Km. 107 Carretera Tijuana-Ensenada, 22860 Ensenada, B.C. México; email: apolinar@cicese.mx > 6CV4 L  
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This paper appears in: ARFTG Conference Digest-Spring, 57th ilLBCS}  
Issue Date : May 2001 ]n1dp2aH  
Volume : 39 zi]%Zp  
On page(s): 1 - 5 "A
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Print ISBN: 0-7803-5686-1 3C>qh{z"  
Digital Object Identifier : 10.1109/ARFTG.2001.327471 yf1CXldi  
Date of Current Version : 12 三月 2007 #G^A-yjn  
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Abstract H6kf K5,  
This paper deals with the de-embedding problem of devices mounted in test fixtures. An original matrix approach for the de-embedding of the scattering parameters of the device under test (DUT) is presented. The implementation of this new de-embedding method uses a non-reflecting line (L), a reflect (R), and a match (M) as standards. The main feature of the proposed method is that the wave propagation constant is not needed in the de-embedding process. Because no redundancy is involved in the computations, this .. i\}:hU-U  
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