[仿真]Simulation of Ion Noise in Microwave Tubes

Abstract—The ion noise in microwave tube is studied using --`W1!jI@  
two-dimensional particle-in-cell method. The fluctuation of the ion [#:yOZt  
amount, which is the source of ion noise of the tube, is observed in 3[kl` *`  
the simulation process. It is found that the sufficient ions amount in ZmaW]3$  
drift tube and beam envelope scalloping appear to be responsible dTU`@!f  
for ion noise after changing the gas pressure, magnetic focusing bh5C  
field, and drift tube length. A great number ions escape radially BJZGQrsz  
and their amount is about half of the beam electron when ion 2m&?t_W  
noise occurs. The number of secondary electron is less than that :|ytw=3>  
of the ion and beam electron; it affects the ion noise very slightly. K}LF ${bS  
There are two ways can be used for depressing the ion noise. The iA"H*0  
first is adjusting or increasing the magnetic focusing field in drift 0}Qd  
tube. The second is creating static electric field gradient to make Ao *{#z   
the ion .. HN&]`cr;  
qyBo|AQ5  

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