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[仿真]A Hybrid Approach To Decrease Port Influence In Transmission Line Charaterization

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注册：2008-07-08
登录：2009-11-17
发帖：33
等级：仿真新人

0楼发表于: 2009-02-21 22:37:56

Abstract!aCharacterization and models for multi-gigabit
signaling is an important issue in modern digital system. A good
physical based model relies on a precise characterization of the
test board. Typically, the characterization of the test board is
associated with scattering matrix parameter measurement, which
can be done with a VNA (Vector Network Analyzer) in the
frequency-domain or a TDR (Time Domain Reflectometer) in the
time-domain. The commonly used launch techniques on PCBs
(Printed Circuit Boards) associated with the VNA or TDR
measurement in the microwave frequency range use SMA or 3.5
mm connectors, in edge-launch or vertical-launch fashions. The
transition between the launch port and the DUT (Device Under
Test) introduces errors in the measurement. Embedding/de-
embedding techniques are used to remove the port influences in
the measurement generally. For example, TRL (Through,
Reflect, and Line) calibration is the typical method used in
measurement to eliminate port influences. However, extra test
kits are needed for TRL calibration, and furthermore the TRL
calibration is sometimes difficult to implement, such as in
coupled differential lines. In this paper, an effective hybrid
approach for transmission line characterization is proposed,
which includes choosing a suitable port laun ..

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