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【资料分享】【pdf】【13卷】SI、PI、EMC 方向 ..
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【资料分享】【pdf】【13卷】SI、PI、EMC 方向的一本宝书 2008年11月出版
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myshuixiang
路は曼曼として其れ修远なり
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发表于: 2008-11-24 21:59:33
— 本帖被 stoney 执行加亮操作(2009-07-10) —
关键词:
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资料分享】【pdf】【13分卷】
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<Signal Integrity and Radiated Emission of High-Speed Digital Systems>
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信号完整性、电源完整性及电磁兼容 方向的一本宝书
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2008年11月出版(国外最新理论及科研成果的结晶)
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Wiley上下载到了电子版,看了内容,深受感动。。。。
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这是一本高速PCB的信号完整性,电源完整性和电磁兼容方面一本不可多见的宝书
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与以往信号完整性领域的三大宝书内容相比有不少亮点,应该说是该领域最新成果的总结和阐述,理论性和实践性都很强啊。
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尤其要写论文的,这本书很有参考价值。
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建议搞这方面的朋友们下载来看看。
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2009年1月在国外出版发行,国内好像买不到。
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到处网店都搜过了。
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但是可以到国外网店用双币卡买,或者国际信用卡买。
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内容简介:
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Author
Caniggia, Spartaco
Dewey
621.382
Format
Hardcover
ISBN
0470511664
MSRP
150.00
Pages
00552
Publication Date
08/2008
Roles
Caniggia, Spartaco : Author
Roles
Maradei, Francescaromana : Author
Subject
Telecommunications
Subject
Waves & Wave Mechanics
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Before putting digital systems for information technology or telecommunication applications on the market, an essential requirement is to perform tests in order to comply with the limits of radiated emission imposed by the standards. This book provides an investigation into signal integrity (SI) and electromagnetic interference (EMI) problems. Topics such as reflections, crosstalk, switching noise and radiated emission (RE) in high-speed digital systems are covered, which are essential for IT and telecoms applications. The highly important topic of modelling is covered which can reduce costs by enabling simulation data to demonstrate that a product meets design specifications and regulatory limits. According to the new European EMC directive, this can help to avoid the expensive use of large semi-anechoic chambers or open area test sites for radiated emission assessments. Following a short introduction to signalling and radiated interference in digital systems, the book provides a detailed characterization of logic families in terms of static and dynamic characteristic useful for modelling techniques. Crosstalk in multi-coupled line structures are investigated by analytical, graphical and circuit-based methods, and techniques to mitigate these phenomena are provided. Grounding, filtering and shielding with multilayer PCBs are also examined and design rules given.
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Written by authors with extensive experience in industry and academia.
Explains basic conceptual problems from a theoretical and practical point of view by using numerous measurements and simulations.
Presents models for mathematical and SPICE-like circuit simulators.
Provides examples of using full-wave codes for SI and RE investigations.
Companion website containing lists of codes and sample material.
Signal Integrity and Radiated Emission of High-Speed Digital Systems
is a valuable resource to industrial designers of information technology, telecommunication equipment and automation equipment as well as to development engineers. It will also be of interest to managers and designers of consumer electronics, and researchers in electronics.
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Contents
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List of Examples xiii
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Foreword xvii
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Preface xix
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1 Introduction to Signal Integrity and Radiated Emission in a Digital System 1
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1.1 Power and Signal Integrity 2
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1.1.1 Power Distribution Network 3
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1.1.2 Signal Distribution Network 5
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1.1.3 Noise Limitations and Design for Characteristic Impedance 7
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1.2 Radiated Emission 9
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1.2.1 Definition of Radiated Emission Sources 9
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1.2.2 Radiated Emission Standards 11
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1.2.3 Radiated Emission from a Real System 17
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1.3 Signaling and Logic Devices 19
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1.3.1 Overshoot, Undershoot and Plateau 20
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1.3.2 Noise Immunity 24
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1.3.3 Timing Parameters 25
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1.3.4 Eye Diagram 27
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1.4 Modeling Digital Systems 29
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1.4.1 Mathematical Tools 29
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1.4.2 Spice-Like Circuit Simulators 30
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1.4.3 Full-Wave Numerical Tools 31
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1.4.4 Professional Simulators 34
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References 34
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2 High-Speed Digital Devices 37
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2.1 Input/Output Static Characteristic 37
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2.1.1 Current and Voltage Specifications 37
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2.1.2 Transistor–Transistor Logic (TTL) Devices 39
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2.1.3 Complementary Metal Oxide Semiconductor (CMOS) Devices 42
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2.1.4 Emitter-Coupled Logic (ECL) Devices 44
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2.1.5 Low-Voltage Differential Signal (LVDS) Devices 45
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2.1.6 Logic Devices Powered and the Logic Level 45
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2.2 Dynamic Characteristics: Gate Delay and Rise and Fall Times 46
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2.3 Driver and Receiver Modeling 48
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2.3.1 Types of Driver Model 48
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